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A new technique for evaluating stacked nanosheet inner spacer TDDB reliability.
Tian Shen
Koji Watanabe
Huimei Zhou
Michael Belyansky
Erin Stuckert
Jingyun Zhang
Andrew Greene
Veeraraghavan S. Basker
Miaomiao Wang
Published in:
IRPS (2020)
Keyphrases
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object recognition
artificial intelligence
high quality
real time
real world
data mining
decision making
feature extraction
expert systems
pairwise
artificial neural networks
multiresolution
management system
transmission line
highly reliable
software reliability