Veeraraghavan S. Basker

Publication Activity (10 Years)

Years Active: 2019-2021
Publications (10 Years): 3

Top Topics

Multiresolution

Silicon Dioxide

Reliability Assessment

Top Venues

Publications

Huimei Zhou, Miaomiao Wang, Ruqiang Bao, Tian Shen, Ernest Wu, Richard G. Southwick, Jingyun Zhang, Veeraraghavan S. Basker, Dechao Guo
TDDB Reliability in Gate-All-Around Nanosheet. IRPS (2021)
Tian Shen, Koji Watanabe, Huimei Zhou, Michael Belyansky, Erin Stuckert, Jingyun Zhang, Andrew Greene, Veeraraghavan S. Basker, Miaomiao Wang
A new technique for evaluating stacked nanosheet inner spacer TDDB reliability. IRPS (2020)
Miaomiao Wang, Jingyun Zhang, Huimei Zhou, Richard G. Southwick, Robin Hsin Kuo Chao, Xin Miao, Veeraraghavan S. Basker, Tenko Yamashita, Dechao Guo, Gauri Karve, Huiming Bu, James H. Stathis
Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor. IRPS (2019)