Ruqiang Bao

Publication Activity (10 Years)

Years Active: 2017-2022
Publications (10 Years): 4

Top Topics

Silicon Dioxide

Reliability Assessment

Leakage Current

Gate Dielectrics

Top Venues

Publications

Huimei Zhou, Miaomiao Wang, Ruqiang Bao, Curtis Durfee, Liqiao Qin, Jingyun Zhang
SiGe Gate-All-around Nanosheet Reliability. IRPS (2022)
Huimei Zhou, Miaomiao Wang, Ruqiang Bao, Tian Shen, Ernest Wu, Richard G. Southwick, Jingyun Zhang, Veeraraghavan S. Basker, Dechao Guo
TDDB Reliability in Gate-All-Around Nanosheet. IRPS (2021)
Huimei Zhou, Miaomiao Wang, Jingyun Zhang, Koji Watanabe, Curtis Durfee, Shogo Mochizuki, Ruqiang Bao, Richard G. Southwick, Maruf Bhuiyan, Basker Veeraraghavan
NBTI Impact of Surface Orientation in Stacked Gate-All-Around Nanosheet Transistor. IRPS (2020)
ChoongHyun Lee, Richard G. Southwick, Shogo Mochizuki, Paul Jamison, Ruqiang Bao, Rajan Pandey, Aniruddha Konar, Takashi Ando, Vijay Narayanan, Bala Haran, Hemanth Jagannathan
Interface engineering of Si1-xGex gate stacks for high performance dual channel CMOS. ASICON (2017)