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TDDB Reliability in Gate-All-Around Nanosheet.

Huimei ZhouMiaomiao WangRuqiang BaoTian ShenErnest WuRichard G. SouthwickJingyun ZhangVeeraraghavan S. BaskerDechao Guo
Published in: IRPS (2021)
Keyphrases
  • learning algorithm
  • database
  • artificial intelligence
  • feature selection
  • image segmentation
  • support vector
  • relational databases
  • medical images
  • markov chain
  • high density
  • failure rate
  • reliability assessment