Huiming Bu

Publication Activity (10 Years)

Years Active: 2010-2019
Publications (10 Years): 1

Top Topics

Silicon Dioxide

Reliability Analysis

Top Venues

Publications

Miaomiao Wang, Jingyun Zhang, Huimei Zhou, Richard G. Southwick, Robin Hsin Kuo Chao, Xin Miao, Veeraraghavan S. Basker, Tenko Yamashita, Dechao Guo, Gauri Karve, Huiming Bu, James H. Stathis
Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor. IRPS (2019)
Ali Khaki-Firooz, Kangguo Cheng, Basanth Jagannathan, Pranita Kulkarni, Jeffrey W. Sleight, Davood Shahrjerdi, Josephine B. Chang, Sungjae Lee, Junjun Li, Huiming Bu, Robert Gauthier, Bruce Doris, Ghavam Shahidi
Fully depleted extremely thin SOI for mainstream 20nm low-power technology and beyond. ISSCC (2010)