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Impact of Gate Stack Thermal Budget on NBTI Reliability in Gate-All-Around Nanosheet P-type Devices.

Huimei ZhouMiaomiao WangNicolas LoubetAndrew GaulYasir Sulehria
Published in: IRPS (2023)
Keyphrases
  • nano scale
  • infrared
  • multiple input
  • liquid crystal displays
  • neural network
  • machine learning
  • parallel processing
  • reliability analysis
  • high impact