Login / Signup

Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization of Ferroelectric Capacitors Under Bipolar Stress Conditions.

Priyankka Gundlapudi RavikumarPrasanna Venkatesan RavindranKhandker Akif AabrarTaeyoung SongSharadindu Gopal KirtaniaDipjyoti DasChinsung ParkNashrah AfrozeMengkun TianShimeng YuAhmad Ehtesham IslamSuman DattaSouvik MahapatraAsif Islam Khan
Published in: IRPS (2024)
Keyphrases
  • high density
  • sufficient conditions
  • positive and negative
  • decision making
  • similarity measure
  • multiscale
  • information systems
  • data structure
  • travel time
  • integrated circuit