Login / Signup
Prediction of NBTI stress and recovery time kinetics in Si capped SiGe p-MOSFETs.
Narendra Parihar
Souvik Mahapatra
Published in:
IRPS (2018)
Keyphrases
</>
prediction accuracy
solar cell
prediction error
thin film
real time
data sets
computer vision
low cost
prediction model
neural network
real world
data structure
evolutionary algorithm
experimental data
image recovery
database replication