Sign in

Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs.

Satyam KumarTarun SamadderKaransingh ThakorUma SharmaSouvik Mahapatra
Published in: IRPS (2021)
Keyphrases
  • stochastic models
  • stochastic methods
  • stochastic optimization problems
  • computer vision
  • video sequences
  • d objects
  • low cost
  • edge detection
  • single image
  • experimental data