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Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs.
Satyam Kumar
Tarun Samadder
Karansingh Thakor
Uma Sharma
Souvik Mahapatra
Published in:
IRPS (2021)
Keyphrases
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stochastic models
stochastic methods
stochastic optimization problems
computer vision
video sequences
d objects
low cost
edge detection
single image
experimental data