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Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories.

Karansingh ThakorNikhil RangarajanHimanshu DiwakarRashmi SaikiaTarun SamadderSouvik MahapatraShyam RaghunathanYingda Dong
Published in: IMW (2024)
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