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Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology.

Leitao LiuJingtian FangAshish PalPlamen AsenovMohit BajajBei DengXi-Wei LinSouvik MahapatraSubi KengeriEl Mehdi Bazizi
Published in: IRPS (2024)
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