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On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs.

Narendra PariharUma SharmaRichard G. SouthwickMiaomiao WangJames H. StathisSouvik Mahapatra
Published in: IRPS (2019)
Keyphrases
  • solar cell
  • evolutionary algorithm
  • low frequency
  • arc consistency
  • thin film
  • real world
  • data mining
  • relational databases
  • cost function