Klas Lilja

Publication Activity (10 Years)

Years Active: 1998-2018
Publications (10 Years): 6

Top Topics

Ibm Zenterprise

Error Detection

Top Venues

Publications

Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (9) (2018)
Eric Cheng, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Keith A. Campbell, Deming Chen, Chen-Yong Cher, Hyungmin Cho, Binh Q. Le, Klas Lilja, Shahrzad Mirkhani, Kevin Skadron, Mircea Stan, Lukasz G. Szafaryn, Christos Vezyrtzis, Subhasish Mitra
Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. ICCD (2017)
Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). CoRR (2017)
Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
CLEAR: Cross-Layer Exploration for Architecting Resilience - Combining Hardware and Software Techniques to Tolerate Soft Errors in Processor Cores. CoRR (2016)
Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
Clear: c̲ross-l̲ayer e̲xploration for a̲rchitecting r̲esilience combining hardware and software techniques to tolerate soft errors in processor cores. DAC (2016)
Marek Turowski, Klas Lilja
Single-event effects in advanced CMOS technologies - Analysis and mitigation. MIXDES (2015)
Dan Wake, Klas Lilja, Victor Moroz
A Hybrid Mesh Generation Method for Two and Three Dimensional Simulation of Semiconductor Processes and Devices. IMR (1998)