Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights.
Eric ChengJacob A. AbrahamPradip BoseAlper BuyuktosunogluKeith A. CampbellDeming ChenChen-Yong CherHyungmin ChoBinh Q. LeKlas LiljaShahrzad MirkhaniKevin SkadronMircea StanLukasz G. SzafarynChristos VezyrtzisSubhasish MitraPublished in: ICCD (2017)