Shahrzad Mirkhani

Publication Activity (10 Years)

Years Active: 2001-2019
Publications (10 Years): 6

Top Topics

Big Data Analytics

Regression Model

Ibm Zenterprise

Top Venues

Publications

Balavinayagam Samynathan, Keith Chapman, Mehdi Nik, Behnam Robatmili, Shahrzad Mirkhani, Maysam Lavasani
Computational Storage For Big Data Analytics. ADMS@VLDB (2019)
Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (9) (2018)
Eric Cheng, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Keith A. Campbell, Deming Chen, Chen-Yong Cher, Hyungmin Cho, Binh Q. Le, Klas Lilja, Shahrzad Mirkhani, Kevin Skadron, Mircea Stan, Lukasz G. Szafaryn, Christos Vezyrtzis, Subhasish Mitra
Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. ICCD (2017)
Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). CoRR (2017)
Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
CLEAR: Cross-Layer Exploration for Architecting Resilience - Combining Hardware and Software Techniques to Tolerate Soft Errors in Processor Cores. CoRR (2016)
Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
Clear: c̲ross-l̲ayer e̲xploration for a̲rchitecting r̲esilience combining hardware and software techniques to tolerate soft errors in processor cores. DAC (2016)
Shahrzad Mirkhani, Subhasish Mitra, Chen-Yong Cher, Jacob A. Abraham
Efficient soft error vulnerability estimation of complex designs. DATE (2015)
Shahrzad Mirkhani, Balavinayagam Samynathan, Jacob A. Abraham
In-depth soft error vulnerability analysis using synthetic benchmarks. VTS (2015)
Shahrzad Mirkhani, Jacob A. Abraham
Fast evaluation of test vector sets using a simulation-based statistical metric. VTS (2014)
Shahrzad Mirkhani, Jacob A. Abraham
EAGLE: A regression model for fault coverage estimation using a simulation based metric. ITC (2014)
Shahrzad Mirkhani, Hyungmin Cho, Subhasish Mitra, Jacob A. Abraham
Rethinking error injection for effective resilience. ASP-DAC (2014)
Hyungmin Cho, Shahrzad Mirkhani, Chen-Yong Cher, Jacob A. Abraham, Subhasish Mitra
Quantitative evaluation of soft error injection techniques for robust system design. DAC (2013)
Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow
FALCON: Rapid statistical fault coverage estimation for complex designs. ITC (2012)
Naghmeh Karimi, Shahrzad Mirkhani, Zainalabedin Navabi, Fabrizio Lombardi
RT level reliability enhancement by constructing dynamic TMRS. ACM Great Lakes Symposium on VLSI (2007)
Parisa Razaghi, Shahrzad Mirkhani, Zainalabedin Navabi
A Configurable Transaction Level Model of a Generic Interconnection Part of Embedded Systems Used in an ESL Design Library. FDL (2007)
Naghmeh Karimi, Shahrzad Mirkhani, Zainalabedin Navabi
ESTA: An Efficient Method for Reliability Enhancement of RT-Level Designs. ATS (2006)
Shahrzad Mirkhani, Zainalabedin Navabi
Enhancing Fault Simulation Performance by Dynamic Fault Clustering. Asian Test Symposium (2005)
Zainalabedin Navabi, Shahrzad Mirkhani, Meisam Lavasani, Fabrizio Lombardi
Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault Simulation. J. Electron. Test. 20 (6) (2004)
Shahrzad Mirkhani, Meisam Lavasani, Zainalabedin Navabi
Hierarchical Fault Simulation Using Behavioral and Gate Level Hardware Models. Asian Test Symposium (2002)
Mina Zolfy, Shahrzad Mirkhani, Zainalabedin Navabi
Adaptation of an event-driven simulation environment to sequentially propagated concurrent fault simulation. DATE (2001)
Hamed Farshbaf, Mina Zolfy, Shahrzad Mirkhani, Zainalabedin Navabi
Fault Simulation for VHDL Based Test Bench and BIST Evaluation. Asian Test Symposium (2001)