Naghmeh Karimi

Publication Activity (10 Years)

Years Active: 2006-2024
Publications (10 Years): 69

Top Topics

Security Vulnerabilities

Injection Attacks

Protection Schemes

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Javad Bahrami, Mohammad Ebrahimabadi, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
Impact of Process Mismatch and Device Aging on SR-Latch Based True Random Number Generators. COSADE (2024)
Mohammad Ebrahimabadi, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, Jean-Max Dutertre, Naghmeh Karimi
DELFINES: Detecting Laser Fault Injection Attacks via Digital Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43 (3) (2024)
Md Toufiq Hasan Anik, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
On the Resiliency of Protected Masked S-Boxes Against Template Attack in the Presence of Temperature and Aging Misalignments. IEEE Trans. Very Large Scale Integr. Syst. 32 (5) (2024)
Sofiane Takarabt, Javad Bahrami, Mohammad Ebrahimabadi, Sylvain Guilley, Naghmeh Karimi
Securing ISW Masking Scheme Against Glitches. DATE (2024)
Mohammad Ebrahimabadi, Javad Bahrami, Mohamed Younis, Naghmeh Karimi
Digital Twin Integrity Protection in Distributed Control Systems. CCNC (2024)
Naghmeh Karimi
The 28th IEEE European Test Symposium. IEEE Des. Test 41 (1) (2024)
Naghmeh Karimi
The 41st IEEE VLSI Test Symposium. IEEE Des. Test 40 (5) (2023)
Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Aging-Induced Failure Prognosis via Digital Sensors. ACM Great Lakes Symposium on VLSI (2023)
Javad Bahrami, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Special Session: Security Verification & Testing for SR-Latch TRNGs. VTS (2023)
Farshad Firouzi, Krishnendu Chakrabarty, Naghmeh Karimi, Bahareh J. Farahani, Diana Goehringer, Aurora Gil de Castro, Marc Reichenbach, Kun-Chih Chen
Welcome Message from the Chairs. COINS (2023)
Satoshi Kai, Takao Kondo, Naghmeh Karimi, Konstantinos Mersinas, Marc Sel, Roberto Yus, Satoru Tezuka
International Mutual Recognition: A Description of Trust Services in US, UK, EU and JP and the Testbed "Hakoniwa". SECRYPT (2023)
Javad Bahrami, Jean-Luc Danger, Mohammad Ebrahimabadi, Sylvain Guilley, Naghmeh Karimi
Challenges in Generating True Random Numbers Considering the Variety of Corners, Aging, and Intentional Attacks. ICICDT (2023)
Sofiane Takarabt, Javad Bahrami, Mohammad Ebrahimabadi, Sylvain Guilley, Naghmeh Karimi
Security Order of Gate-Level Masking Schemes. HOST (2023)
Suhee Sanjana Mehjabin, Ali Tekeoglu, Mohamed F. Younis, Mohammad Ebrahimabadi, Rahul Chandran, Tamim Sookoor, Naghmeh Karimi
A Networked System Dependability Validation Framework Using Physical and Virtual Nodes. IEEE Access 11 (2023)
Wassila Lalouani, Mohamed Younis, Mohammad Ebrahimabadi, Naghmeh Karimi
Robust and Efficient Data Security Solution for Pervasive Data Sharing in IoT. CCNC (2022)
Javad Bahrami, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Leakage Power Analysis in Different S-Box Masking Protection Schemes. DATE (2022)
Mohammad Ebrahimabadi, Mohamed F. Younis, Wassila Lalouani, Naghmeh Karimi
An Attack Resilient PUF-based Authentication Mechanism for Distributed Systems. VLSID (2022)
Wassila Lalouani, Mohamed Younis, Mohammad Ebrahimabadi, Naghmeh Karimi
Collusion-resistant PUF-based Distributed Device Authentication Protocol for Internet of Things. GLOBECOM (2022)
Mohammad Ebrahimabadi, Mohamed F. Younis, Naghmeh Karimi
A PUF-Based Modeling-Attack Resilient Authentication Protocol for IoT Devices. IEEE Internet Things J. 9 (5) (2022)
Javad Bahrami, Mohammad Ebrahimabadi, Sofiane Takarabt, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
On the Practicality of Relying on Simulations in Different Abstraction Levels for Pre-silicon Side-Channel Analysis. SECRYPT (2022)
Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
Assessment and Mitigation of Power Side-Channel-Based Cross-PUF Attacks on Arbiter-PUFs and Their Derivatives. IEEE Trans. Very Large Scale Integr. Syst. 30 (2) (2022)
Mehdi Sadi, Yi He, Yanjing Li, Mahabubul Alam, Satwik Kundu, Swaroop Ghosh, Javad Bahrami, Naghmeh Karimi
Special Session: On the Reliability of Conventional and Quantum Neural Network Hardware. VTS (2022)
Trevor Kroeger, Wei Cheng, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs. J. Electron. Test. 38 (3) (2022)
Mohammad Ebrahimabadi, Mohamed F. Younis, Wassila Lalouani, Naghmeh Karimi
An Attack Resilient PUF-based Authentication Mechanism for Distributed Systems. CoRR (2022)
Mohammad Ebrahimabadi, Bijan Fadaeinia, Amir Moradi, Naghmeh Karimi
Does Aging Matter? The Curious Case of Fault Sensitivity Analysis. ISQED (2022)
Farzad Niknia, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Aging Effects on Template Attacks Launched on Dual-Rail Protected Chips. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (5) (2022)
Wassila Lalouani, Mohamed F. Younis, Mohammad Ebrahimabadi, Naghmeh Karimi
Countering Modeling Attacks in PUF-based IoT Security Solutions. ACM J. Emerg. Technol. Comput. Syst. 18 (3) (2022)
Mohammad Ebrahimabadi, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, Jean-Max Dutertre, Naghmeh Karimi
Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors. HOST (2022)
Mohammad Ebrahimabadi, Mohamed F. Younis, Wassila Lalouani, Abdulaziz Alshaeri, Naghmeh Karimi
SWeeT: Security Protocol for Wearables Embedded Devices' Data Transmission. HealthCom (2022)
Mohammad Ebrahimabadi, Mohamed F. Younis, Wassila Lalouani, Naghmeh Karimi
A Novel Modeling-Attack Resilient Arbiter-PUF Design. VLSI Design (2021)
Mohammad Ebrahimabadi, Mohamed F. Younis, Naghmeh Karimi
Hardware Assisted Smart Grid Authentication. ICC (2021)
Md Toufiq Hasan Anik, Bijan Fadaeinia, Amir Moradi, Naghmeh Karimi
On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits. ASP-DAC (2021)
Naghmeh Karimi, Kanad Basu, Chip-Hong Chang, Jason M. Fung
Hardware Security in Emerging Technologies: Vulnerabilities, Attacks, and Solutions. IEEE J. Emerg. Sel. Topics Circuits Syst. 11 (2) (2021)
Ashkan Vakil, Ali Mirzaeian, Houman Homayoun, Naghmeh Karimi, Avesta Sasan
AVATAR: NN-Assisted Variation Aware Timing Analysis and Reporting for Hardware Trojan Detection. IEEE Access 9 (2021)
Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Reducing Aging Impacts in Digital Sensors via Run-Time Calibration. J. Electron. Test. 37 (5) (2021)
Md Toufiq Hasan Anik, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Detecting Failures and Attacks via Digital Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (7) (2021)
Ashkan Vakil, Farzad Niknia, Ali Mirzaeian, Avesta Sasan, Naghmeh Karimi
Learning Assisted Side Channel Delay Test for Detection of Recycled ICs. ASP-DAC (2021)
Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
Making Obfuscated PUFs Secure Against Power Side-Channel Based Modeling Attacks. DATE (2021)
Wenye Liu, Chip-Hong Chang, Xueyang Wang, Chen Liu, Jason M. Fung, Mohammad Ebrahimabadi, Naghmeh Karimi, Xingyu Meng, Kanad Basu
Two Sides of the Same Coin: Boons and Banes of Machine Learning in Hardware Security. IEEE J. Emerg. Sel. Topics Circuits Syst. 11 (2) (2021)
Md Toufiq Hasan Anik, Jean-Luc Danger, Omar Diankha, Mohammad Ebrahimabadi, Christoph Frisch, Sylvain Guilley, Naghmeh Karimi, Michael Pehl, Sofiane Takarabt
Testing and Reliability Enhancement of Security Primitives. DFT (2021)
Ke Huang, Md Toufiq Hasan Anik, Xinqiao Zhang, Naghmeh Karimi
Real-Time IC Aging Prediction via On-Chip Sensors. ISVLSI (2021)
Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
Enhancing the Resiliency of Multi-bit Parallel Arbiter-PUF and Its Derivatives Against Power Attacks. COSADE (2021)
Mohammad Ebrahimabadi, Wassila Lalouani, Mohamed F. Younis, Naghmeh Karimi
Countering PUF Modeling Attacks through Adversarial Machine Learning. ISVLSI (2021)
Bijan Fadaeinia, Md Toufiq Hasan Anik, Naghmeh Karimi, Amir Moradi
Masked SABL: A Long Lasting Side-Channel Protection Design Methodology. IEEE Access 9 (2021)
Ashkan Vakil, Farzad Niknia, Ali Mirzaeian, Avesta Sasan, Naghmeh Karimi
Learning Assisted Side Channel Delay Test for Detection of Recycled ICs. CoRR (2020)
Shervin Roshanisefat, Hadi Mardani Kamali, Kimia Zamiri Azar, Sai Manoj Pudukotai Dinakarrao, Naghmeh Karimi, Houman Homayoun, Avesta Sasan
DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain. CoRR (2020)
Ashkan Vakil, Farnaz Behnia, Ali Mirzaeian, Houman Homayoun, Naghmeh Karimi, Avesta Sasan
LASCA: Learning Assisted Side Channel Delay Analysis for Hardware Trojan Detection. ISQED (2020)
Ashkan Vakil, Farnaz Behnia, Ali Mirzaeian, Houman Homayoun, Naghmeh Karimi, Avesta Sasan
LASCA: Learning Assisted Side Channel Delay Analysis for Hardware Trojan Detection. CoRR (2020)
Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Hamed Pirsiavash, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability. ICCD (2020)
Amir Alipour, Vincent Beroulle, Bertrand Cambou, Jean-Luc Danger, Giorgio Di Natale, David Hély, Sylvain Guilley, Naghmeh Karimi
PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. ETS (2020)
Shervin Roshanisefat, Hadi Mardani Kamali, Kimia Zamiri Azar, Sai Manoj Pudukotai Dinakarrao, Naghmeh Karimi, Houman Homayoun, Avesta Sasan
DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain. VTS (2020)
Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
Cross-PUF Attacks on Arbiter-PUFs through their Power Side-Channel. ITC (2020)
Md Toufiq Hasan Anik, Rachit Saini, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Failure and Attack Detection by Digital Sensors. ETS (2020)
Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
Effect of Aging on PUF Modeling Attacks based on Power Side-Channel Observations. DATE (2020)
Md Toufiq Hasan Anik, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
On the Effect of Aging on Digital Sensors. VLSI Design (2020)
James Shey, Naghmeh Karimi, Ryan W. Robucci, Chintan Patel
Implementation-Based Design Fingerprinting for Robust IC Fraud Detection. J. Hardw. Syst. Secur. 3 (4) (2019)
Hassan Salmani, Tamzidul Hoque, Swarup Bhunia, Muhammad Yasin, Jeyavijayan (JV) Rajendran, Naghmeh Karimi
Special Session: Countering IP Security threats in Supply chain. VTS (2019)
Ke Huang, Xinqiao Zhang, Naghmeh Karimi
Real-Time Prediction for IC Aging Based on Machine Learning. IEEE Trans. Instrum. Meas. 68 (12) (2019)
Naghmeh Karimi, Thorben Moos, Amir Moradi
Exploring the Effect of Device Aging on Static Power Analysis Attacks. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2019 (3) (2019)
James Shey, Naghmeh Karimi, Ryan W. Robucci, Chintan Patel
Design-Based Fingerprinting Using Side-Channel Power Analysis for Protection Against IC Piracy. ISVLSI (2018)
Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley
Impact of Aging on the Reliability of Delay PUFs. J. Electron. Test. 34 (5) (2018)
Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley
On the Effect of Aging in Detecting Hardware Trojan Horses with Template Analysis. IOLTS (2018)
Ro Cammarota, Naghmeh Karimi, Siddharth Garg, Jeyavijayan Rajendran
Special session: Recent developments in hardware security. VTS (2018)
Naghmeh Karimi, Sylvain Guilley, Jean-Luc Danger
Impact of Aging on Template Attacks. ACM Great Lakes Symposium on VLSI (2018)
Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi
Device aging: A reliability and security concern. ETS (2018)
Naghmeh Karimi, Jean-Luc Danger, Mariem Slimani, Sylvain Guilley
Impact of the switching activity on the aging of delay-PUFs. ETS (2017)
Naghmeh Karimi, Jean-Luc Danger, Florent Lozach, Sylvain Guilley
Predictive Aging of Reliability of two Delay PUFs. IACR Cryptol. ePrint Arch. 2017 (2017)
Naghmeh Karimi, Jean-Luc Danger, Florent Lozach, Sylvain Guilley
Predictive Aging of Reliability of Two Delay PUFs. SPACE (2016)
Naghmeh Karimi, Ke Huang
Prognosis of NBTI aging using a machine learning scheme. DFT (2016)
Sachhidh Kannan, Naghmeh Karimi, Ozgur Sinanoglu, Ramesh Karri
Security Vulnerabilities of Emerging Nonvolatile Main Memories and Countermeasures. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (1) (2015)
Alexander DeTrano, Sylvain Guilley, Xiaofei Guo, Naghmeh Karimi, Ramesh Karri
Exploiting small leakages in masks to turn a second-order attack into a first-order attack. HASP@ISCA (2015)
Sachhidh Kannan, Naghmeh Karimi, Ramesh Karri, Ozgur Sinanoglu
Modeling, Detection, and Diagnosis of Faults in Multilevel Memristor Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (5) (2015)
Xiaofei Guo, Naghmeh Karimi, Francesco Regazzoni, Chenglu Jin, Ramesh Karri
Simulation and analysis of negative-bias temperature instability aging on power analysis attacks. HOST (2015)
Naghmeh Karimi, Arun Karthik Kanuparthi, Xueyang Wang, Ozgur Sinanoglu, Ramesh Karri
MAGIC: Malicious Aging in Circuits/Cores. ACM Trans. Archit. Code Optim. 12 (1) (2015)
Sachhidh Kannan, Naghmeh Karimi, Ozgur Sinanoglu
Secure Memristor-based Main Memory. DAC (2014)
Sachhidh Kannan, Naghmeh Karimi, Ramesh Karri, Ozgur Sinanoglu
Detection, diagnosis, and repair of faults in memristor-based memories. VTS (2014)
Naghmeh Karimi, Michail Maniatakos, Chandrasekharan Tirumurti, Yiorgos Makris
On the Impact of Performance Faults in Modern Microprocessors. J. Electron. Test. 29 (3) (2013)
Ozgur Sinanoglu, Naghmeh Karimi, Jeyavijayan Rajendran, Ramesh Karri, Yier Jin, K. Huang, Yiorgos Makris
Reconciling the IC test and security dichotomy. ETS (2013)
Jennifer Dworak, Ronald Shawn Blanton, Masahiro Fujita, Kazumi Hatayama, Naghmeh Karimi, Michail Maniatakos, Antonis M. Paschalis, Adit D. Singh, Tian Xia
Special session 4B: Elevator talks. VTS (2013)
Naghmeh Karimi, Krishnendu Chakrabarty
Detection, Diagnosis, and Recovery From Clock-Domain Crossing Failures in Multiclock SoCs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (9) (2013)
Naghmeh Karimi, Krishnendu Chakrabarty, Pallav Gupta, Srinivas Patil
Test generation for clock-domain crossing faults in integrated circuits. DATE (2012)
Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris
Instruction-Level Impact Analysis of Low-Level Faults in a Modern Microprocessor Controller. IEEE Trans. Computers 60 (9) (2011)
Naghmeh Karimi, Zhiqiu Kong, Krishnendu Chakrabarty, Pallav Gupta, Srinivas Patil
Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip. Asian Test Symposium (2011)
Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Chandra Tirumurti, Yiorgos Makris
Workload-Cognizant Concurrent Error Detection in the Scheduler of a Modern Microprocessor. IEEE Trans. Computers 60 (9) (2011)
Naghmeh Karimi, Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris
Impact analysis of performance faults in modern microprocessors. ICCD (2009)
Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris
Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller. VTS (2009)
Michail Maniatakos, Naghmeh Karimi, Yiorgos Makris, Abhijit Jas, Chandra Tirumurti
Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller. DFT (2008)
Naghmeh Karimi, Armin Alaghi, Mahshid Sedghi, Zainalabedin Navabi
Online Network-on-Chip Switch Fault Detection and Diagnosis Using Functional Switch Faults. J. Univers. Comput. Sci. 14 (22) (2008)
Armin Alaghi, Mahshid Sedghi, Naghmeh Karimi, Mahmood Fathy, Zainalabedin Navabi
Reliable NoC architecture utilizing a robust rerouting algorithm. EWDTS (2008)
Armin Alaghi, Mahshid Sedghi, Naghmeh Karimi, Zainalabedin Navabi
NoC Reconfiguration for Utilizing the Largest Fault-free Connected Sub-structure. ITC (2008)
Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Yiorgos Makris
On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. ITC (2008)
Naghmeh Karimi, Soheil Aminzadeh, Saeed Safari, Zainalabedin Navabi
A Novel GA-Based High-Level Synthesis Technique to Enhance RT-Level Concurrent Testing. IOLTS (2008)
Naghmeh Karimi, Shahrzad Mirkhani, Zainalabedin Navabi, Fabrizio Lombardi
RT level reliability enhancement by constructing dynamic TMRS. ACM Great Lakes Symposium on VLSI (2007)
Armin Alaghi, Naghmeh Karimi, Mahshid Sedghi, Zainalabedin Navabi
Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Mode. DFT (2007)
Naghmeh Karimi, Shahrzad Mirkhani, Zainalabedin Navabi
ESTA: An Efficient Method for Reliability Enhancement of RT-Level Designs. ATS (2006)