Md Toufiq Hasan Anik

Publication Activity (10 Years)

Years Active: 2020-2024
Publications (10 Years): 11

Top Topics

Attack Detection

Sensor Technology

Top Venues

J. Electron. Test.

Publications

Md Toufiq Hasan Anik, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
On the Resiliency of Protected Masked S-Boxes Against Template Attack in the Presence of Temperature and Aging Misalignments. IEEE Trans. Very Large Scale Integr. Syst. 32 (5) (2024)
Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Aging-Induced Failure Prognosis via Digital Sensors. ACM Great Lakes Symposium on VLSI (2023)
Md Toufiq Hasan Anik, Bijan Fadaeinia, Amir Moradi, Naghmeh Karimi
On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits. ASP-DAC (2021)
Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Reducing Aging Impacts in Digital Sensors via Run-Time Calibration. J. Electron. Test. 37 (5) (2021)
Md Toufiq Hasan Anik, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Detecting Failures and Attacks via Digital Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (7) (2021)
Md Toufiq Hasan Anik, Jean-Luc Danger, Omar Diankha, Mohammad Ebrahimabadi, Christoph Frisch, Sylvain Guilley, Naghmeh Karimi, Michael Pehl, Sofiane Takarabt
Testing and Reliability Enhancement of Security Primitives. DFT (2021)
Ke Huang, Md Toufiq Hasan Anik, Xinqiao Zhang, Naghmeh Karimi
Real-Time IC Aging Prediction via On-Chip Sensors. ISVLSI (2021)
Bijan Fadaeinia, Md Toufiq Hasan Anik, Naghmeh Karimi, Amir Moradi
Masked SABL: A Long Lasting Side-Channel Protection Design Methodology. IEEE Access 9 (2021)
Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Hamed Pirsiavash, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability. ICCD (2020)
Md Toufiq Hasan Anik, Rachit Saini, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
Failure and Attack Detection by Digital Sensors. ETS (2020)
Md Toufiq Hasan Anik, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
On the Effect of Aging on Digital Sensors. VLSI Design (2020)