Learning Assisted Side Channel Delay Test for Detection of Recycled ICs.

Ashkan Vakil Farzad Niknia Ali Mirzaeian Avesta Sasan Naghmeh Karimi

Published in: ASP-DAC (2021)

Keyphrases

learning algorithm
learning process
incremental learning
learning systems
learning problems
neural network
automatic detection
unsupervised learning
knowledge acquisition
computer vision
supervised learning
detection method
object detection
integrity constraints
hidden markov models
real time
detection accuracy