Login / Signup

Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller.

Michail ManiatakosNaghmeh KarimiChandra TirumurtiAbhijit JasYiorgos Makris
Published in: VTS (2009)
Keyphrases
  • neural network
  • real time
  • data sets
  • low cost
  • higher level
  • dynamic model