Learning Assisted Side Channel Delay Test for Detection of Recycled ICs.

Ashkan Vakil Farzad Niknia Ali Mirzaeian Avesta Sasan Naghmeh Karimi

Published in: CoRR (2020)

Keyphrases

learning process
learning algorithm
learning systems
data sets
reinforcement learning
supervised learning
event detection
prior knowledge
wireless sensor networks
unsupervised learning
learning experience
learning community
detection accuracy