Test generation for clock-domain crossing faults in integrated circuits.

Naghmeh Karimi Krishnendu Chakrabarty Pallav Gupta Srinivas Patil

Published in: DATE (2012)

Keyphrases

integrated circuit
test generation
test cases
mutation testing
built in self test
symbolic execution
design automation
test sequences
software testing
quality assurance
electron beam
static analysis
databases
regular expressions
code coverage
fault diagnosis
real world