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Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip.
Naghmeh Karimi
Zhiqiu Kong
Krishnendu Chakrabarty
Pallav Gupta
Srinivas Patil
Published in:
Asian Test Symposium (2011)
Keyphrases
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power consumption
test cases
high speed
domain specific
data sets
fault diagnosis
hardware and software
fault detection
test suite
test generation
real time
database systems
rough sets
low cost
domain independent
fault model