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RT level reliability enhancement by constructing dynamic TMRS.
Naghmeh Karimi
Shahrzad Mirkhani
Zainalabedin Navabi
Fabrizio Lombardi
Published in:
ACM Great Lakes Symposium on VLSI (2007)
Keyphrases
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image enhancement
data sets
levels of abstraction
dynamically changing
genetic algorithm
pattern recognition
dynamic environments
databases
image processing
image segmentation
search algorithm
lower bound
higher level
reliability analysis