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Soft Sphere Model for Electron Correlation and Scattering in the Atomistic Modelling of Semiconductor Devices.
J. R. Watling
John R. Barker
Asen Asenov
Published in:
VLSI Design (2001)
Keyphrases
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experimental data
similarity measure
computational model
high level
objective function
probabilistic model
management system
statistical model
case study
database systems
image sequences
prior knowledge
high accuracy
energy consumption