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ICMAT 2011 - Reliability and variability of semiconductor devices and ICs.

Asen AsenovUlf SchlichtmannCher Ming TanHei WongXing Zhou
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • semiconductor devices
  • electron beam
  • field effect transistors
  • image registration
  • high accuracy
  • software development
  • intra class
  • failure rate
  • highly reliable
  • reliability analysis