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Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs.
G. Cardoso Medeiros
Moritz Fieback
Anteneh Gebregiorgis
Mottaqiallah Taouil
Leticia Bolzani Poehls
Said Hamdioui
Published in:
ETS (2021)
Keyphrases
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test cases
test generation
artificial intelligence
fuzzy logic
automatic detection
fault diagnosis
database
databases
real time
bayesian networks
expert systems
knowledge base
feature selection
computer vision
test data
model based diagnosis
significantly reduced
test suite