Testing the Configurable Analog Blocks of Field Programmable Analog Arrays.
Tiago R. BalenAntonio Andrade Jr.Florence AzaïsMichel RenovellMarcelo LubaszewskiPublished in: ITC (2004)
Keyphrases
- processor array
- analog vlsi
- focal plane
- circuit design
- analog circuits
- signal processing
- low power
- mixed signal
- data conversion
- floating gate
- test data
- vlsi architecture
- artificial intelligence
- motion estimation
- case study
- relational databases
- variable size
- multiresolution
- single chip
- data mining
- test cases
- image compression