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Analyzing the behavior of FinFET SRAMs with resistive defects.

Thiago Santos CopettiTiago R. BalenGuilherme Cardoso MedeirosLetícia Maria Bolzani Poehls
Published in: VLSI-SoC (2017)
Keyphrases
  • human behavior
  • knowledge base
  • behavior analysis
  • databases
  • multiscale
  • data structure
  • expert systems
  • dynamic behavior