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Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs.
Thiago Santos Copetti
Guilherme Cardoso Medeiros
Letícia Maria Bolzani Poehls
Tiago R. Balen
Published in:
VLSI-SoC (Selected Papers) (2017)
Keyphrases
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neural network
decision trees
object recognition
data sets
information systems
web services
high quality
bayesian networks
data streams
artificial neural networks
hidden markov models
probability distribution
software engineering
high impact