Login / Signup

Analyzing NBTI impact on SRAMs with resistive-open defects.

M. Tulio MartinsG. Cardoso MedeirosThiago CopettiFabian VargasLetícia Maria Bolzani Poehls
Published in: LATS (2016)
Keyphrases
  • defect detection
  • databases
  • neural network
  • multiscale
  • expert systems
  • probabilistic model