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A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs.
G. Cardoso Medeiros
Letícia Maria Veiras Bolzani
Mottaqiallah Taouil
Fabian Vargas
Said Hamdioui
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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high speed
defect detection
real time
information systems
sensor networks
high density
database
case study
low cost
test data
printed circuit boards
automated visual inspection
surface defects
test cases
sensor data
programmable logic