SURFACE DEFECTS
Experts
- Daniel F. García
- Rubén Usamentiaga
- Yunhui Yan
- Kechen Song
- Julio Molleda
- Xuewu Zhang
- Chunhua Yang
- Qiwu Luo
- Kun Liu
- Francisco G. Bulnes
- Haiyong Chen
- Olli Silvén
- Chih-Yang Lin
- Qingyong Li
- Lev Mukhanov
- Xue Wang
- Franz Pernkopf
- Georgios Karakonstantis
- Antti J. Koivo
- Yibin Huang
- Roland T. Chin
- Roger F. Woods
- Hans Vandierendonck
- Fityanul Akhyar
- Jukka Iivarinen
- Bing Wang
- Jorge L. C. Sanz
- Xiaoxin Fang
- Jun Zhang
- Rahul Pandita
- Kui Yuan
- Congying Qiu
- Jiaojiao Su
- Matti Pietikäinen
- Juhani Rauhamaa
- Peng Chen
- Umar Ibrahim Minhas
- Choon-Woo Kim
- Xu Zhang
Venues
- IEEE Trans. Instrum. Meas.
- Sensors
- CoRR
- IEEE Access
- MVA
- ICRA
- Microelectron. Reliab.
- Expert Syst. Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Intell. Manuf.
- Mach. Vis. Appl.
- Image Vis. Comput.
- BMVC
- Multim. Tools Appl.
- Comput. Ind.
- Comput. Electron. Agric.
- J. Intell. Fuzzy Syst.
- IEEE Trans Autom. Sci. Eng.
- IEEE Trans. Intell. Transp. Syst.
- ICIP
- J. Real Time Image Process.
- ICIA
- DAC
- Int. J. Autom. Technol.
- Microprocess. Microsystems
- ICAC
- Int. J. Pattern Recognit. Artif. Intell.
- Neural Comput. Appl.
- Frontiers Neurorobotics
- J. Electronic Imaging
- IEEE Trans. Ind. Informatics
- EURASIP J. Image Video Process.
- IAS
- CASE
- IEEE Trans. Syst. Man Cybern. Syst.
- ICMV
- CCTA (3)
- J. Sensors
- Algorithms
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