SURFACE DEFECTS
Experts
- Daniel F. García
- Rubén Usamentiaga
- Yunhui Yan
- Kechen Song
- Chunhua Yang
- Xuewu Zhang
- Qiwu Luo
- Julio Molleda
- Kun Liu
- Haiyong Chen
- Olli Silvén
- Chih-Yang Lin
- Francisco G. Bulnes
- Yibin Huang
- Fityanul Akhyar
- Choon-Woo Kim
- Franz Pernkopf
- Roland T. Chin
- Jun Zhang
- Rahul Pandita
- Peng Chen
- Georgios Karakonstantis
- Wenyong Yu
- Bing Wang
- Menghui Niu
- Antti J. Koivo
- Qingyong Li
- Umar Ibrahim Minhas
- Kui Yuan
- Jukka Iivarinen
- Jiaojiao Su
- Xu Zhang
- Juhani Rauhamaa
- Hans Vandierendonck
- Matti Pietikäinen
- Jorge L. C. Sanz
- Xiaoxin Fang
- Xue Wang
- Congying Qiu
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- MVA
- ICRA
- Expert Syst. Appl.
- Microelectron. Reliab.
- J. Intell. Manuf.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Electron. Agric.
- Image Vis. Comput.
- Mach. Vis. Appl.
- Multim. Tools Appl.
- BMVC
- IEEE Trans. Ind. Informatics
- IEEE Trans. Intell. Transp. Syst.
- J. Intell. Fuzzy Syst.
- Comput. Ind.
- ICIA
- J. Real Time Image Process.
- ICIP
- IEEE Trans Autom. Sci. Eng.
- DAC
- Neural Comput. Appl.
- Signal Image Video Process.
- Frontiers Neurorobotics
- Int. J. Pattern Recognit. Artif. Intell.
- IAS
- Microprocess. Microsystems
- ICCAD
- ICAC
- CASE
- Int. J. Autom. Technol.
- EURASIP J. Image Video Process.
- J. Electronic Imaging
- VISIGRAPP (4: VISAPP)
- CCTA (3)
- ICIRA (2)
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