Analysing NBTI Impact on SRAMs with Resistive Defects.

M. Tulio Martins G. Cardoso Medeiros Thiago Copetti Fabian Vargas Marcus Pohls

Published in: J. Electron. Test. (2017)

Keyphrases

artificial intelligence
pairwise
defect detection
information retrieval
genetic algorithm
high quality
defect classification
data sets
object recognition
user interface
evolutionary algorithm
management system