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12th "IEEE Latin-American Test Workshop" Porto de Galinhas, Brazil, 27-30 March 2011.

Víctor H. ChampacFernanda Gusmão de Lima KastensmidtLetícia Maria Veiras Bolzani PoehlsFabian VargasYervant Zorian
Published in: J. Low Power Electron. (2011)
Keyphrases
  • latin american
  • data sets
  • neural network
  • multiscale
  • information technology
  • test cases
  • information systems
  • metadata
  • artificial neural networks
  • floating point