Felipe G. A. e Silva

Publication Activity (10 Years)

Years Active: 2016-2023
Publications (10 Years): 11

Top Topics

Error Correction

Top Venues

Publications

Marco P. Stefani, César A. M. Marcon, Felipe G. A. e Silva, Jarbas Silveira
Memory Controller with Adaptive ECC for Reliable System Operation. SBCCI (2023)
Felipe G. A. e Silva, Alan Cadore Pinheiro, Jarbas A. N. Silveira, César A. M. Marcon
A Triple Burst Error Correction Based on Region Selection Code. IEEE Trans. Very Large Scale Integr. Syst. 31 (8) (2023)
Felipe G. A. e Silva, Adahil Muniz, Marco P. Stefani, Jarbas Silveira, César A. M. Marcon
Expanding Column Line Code Adaptive (CLC-A) for Protecting 32-and 64-Bit Data. IEEE Des. Test 39 (2) (2022)
Alan Cadore Pinheiro, Daniel A. B. Tavares, Felipe G. A. e Silva, Jarbas Silveira, César A. M. Marcon
Optimized buffer protection for network-on-chip based on Error Correction Code. Microelectron. J. 100 (2020)
Felipe G. A. e Silva, Adahil Muniz, Jarbas Silveira, César A. M. Marcon
CLC-A: An Adaptive Implementation of the Column Line Code (CLC) ECC. SBCCI (2020)
Moabe F. Domingos, George H. Castro, Jarbas Silveira, Felipe G. A. e Silva, M. K. D. Pereira, Pedro Lima
MMS: A Software for Error Monitoring in Memories Protected by ECC. LATS (2020)
Alan Cadore Pinheiro, Jarbas A. N. Silveira, Daniel A. B. Tavares, Felipe G. A. e Silva, César A. M. Marcon
Optimized Fault-Tolerant Buffer Design for Network-on-Chip Applications. LASCAS (2019)
Felipe G. A. e Silva, Jardel Silveira, Jarbas Silveira, César A. M. Marcon, Fabian Vargas, Otávio Alcântara de Lima Jr.
An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays. J. Electron. Test. 34 (4) (2018)
Felipe G. A. e Silva, Walter Magalhaes, Jarbas Silveira, Joao Marcelo Ferreira, Philippe de S. Magalhães, Otávio A. de Lima, César A. M. Marcon
Evaluation of multiple bit upset tolerant codes for NoCs buffering. LASCAS (2017)
Felipe G. A. e Silva, Otávio A. de Lima, Walter da C. Freitas, Fabian Vargas, Jarbas Silveira, César A. M. Marcon
An efficient, low-cost ECC approach for critical-application memories. SBCCI (2017)
Helano de S. Castro, Jarbas A. N. da Silveira, Alexandre A. P. Coelho, Felipe G. A. e Silva, Philippe de S. Magalhães, Otávio A. de Lima
A correction code for multiple cells upsets in memory devices for space applications. NEWCAS (2016)