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BICS-based March test for resistive-open defect detection in SRAMs.

Raul ChipanaLetícia Maria Veiras BolzaniFabian Vargas
Published in: LATW (2010)
Keyphrases
  • defect detection
  • feature extraction
  • databases
  • neural network
  • genetic algorithm
  • information systems
  • three dimensional
  • data structure
  • cooperative