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Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process Variations.

Víctor H. ChampacHector VillacortaRoberto Gómez-FuentesFabian VargasJaume Segura
Published in: LATS (2022)
Keyphrases
  • real time
  • artificial intelligence
  • probability distribution
  • x ray
  • microscopy images