Hector Villacorta

Publication Activity (10 Years)

Years Active: 2010-2024
Publications (10 Years): 8

Top Topics

Stability Of Feature Selection

Multidimensional Signals

Hilbert Huang Transform

Top Venues

J. Electron. Test.

Publications

Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura
Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations. J. Electron. Test. 40 (1) (2024)
Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura
Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process Variations. LATS (2022)
Víctor H. Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas
Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell. J. Electron. Test. 37 (3) (2021)
Zahira Perez, Javier Mesalles, Hector Villacorta, Fabian Vargas, Víctor H. Champac
Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells. LATS (2020)
Freddy Forero, Hector Villacorta, Michel Renovell, Víctor H. Champac
Modeling and Detectability of Full Open Gate Defects in FinFET Technology. IEEE Trans. Very Large Scale Integr. Syst. 27 (9) (2019)
Zahira Perez, Hector Villacorta, Víctor H. Champac
An accurate novel gate-sizing metric to optimize circuit performance under local intra-die process variations. VLSI-SoC (2018)
Hector Villacorta, Jaume Segura, Víctor H. Champac
Impact of Fin-Height on SRAM Soft Error Sensitivity and Cell Stability. J. Electron. Test. 32 (3) (2016)
Francisco Mesalles, Hector Villacorta, Michel Renovell, Víctor H. Champac
Behavior and test of open-gate defects in FinFET based cells. ETS (2016)
Hector Villacorta, Jose Luis Garcia-Gervacio, Jaume Segura, Víctor H. Champac
and body bias conditions for testing bridge defects in the presence of process variations. Microelectron. J. 46 (5) (2015)
Hector Villacorta, Roberto Gómez, Sebastià A. Bota, Jaume Segura, Víctor H. Champac
Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell. LATS (2015)
Hector Villacorta, Jaume Segura, Sebastià A. Bota, Víctor H. Champac
Analysis of fin height on FinFET SRAM cell hardening. MWSCAS (2014)
Víctor H. Champac, Hector Villacorta, Nestor Hernandez, Joan Figueras
Skew violation verification in digital interconnect signals based on signal addition. IEICE Electron. Express 11 (15) (2014)
Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura, Roberto Gómez
Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. IEEE Des. Test 30 (6) (2013)
Hector Villacorta, Jose Luis Garcia-Gervacio, Víctor H. Champac, Sebastià A. Bota, Jaime Martínez-Castillo, Jaume Segura
Bridge defect detection in nanometer CMOS circuits using Low VDD and body bias. LATW (2013)
Hector Villacorta, Víctor H. Champac, Sebastià A. Bota, Jaume Segura
and body bias in a delay based test. Microelectron. Reliab. 52 (11) (2012)
Hector Villacorta, Víctor H. Champac, Chuck Hawkins, Jaume Segura
Reliability analysis of small delay defects in vias located in signal paths. LATW (2010)