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Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell.
Hector Villacorta
Roberto Gómez
Sebastià A. Bota
Jaume Segura
Víctor H. Champac
Published in:
LATS (2015)
Keyphrases
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error rate
noise level
test set
training error
estimation error
power consumption
lower error rates
misclassification rate
support vector
data transmission
equal error rate
data sets
information retrieval
similarity measure
word error rate
false discovery rate