Roberto Gómez

Publication Activity (10 Years)

Years Active: 2005-2018
Publications (10 Years): 2

Top Topics

Equal Error Rate

Euclidean Metric

Reliability Analysis

Top Venues

Publications

Andres F. Gomez, Roberto Gómez, Víctor H. Champac
A metric-guided gate-sizing methodology for aging guardband reduction. LATS (2018)
Hector Villacorta, Roberto Gómez, Sebastià A. Bota, Jaume Segura, Víctor H. Champac
Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell. LATS (2015)
Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura, Roberto Gómez
Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. IEEE Des. Test 30 (6) (2013)
Víctor H. Champac, Julio Vazquez Hernandez, Salvador Barcelo, Roberto Gómez, Chuck Hawkins, Jaume Segura
Testing of Stuck-Open Faults in Nanometer Technologies. IEEE Des. Test Comput. 29 (4) (2012)
Roberto Gómez, Víctor H. Champac, Chuck Hawkins, Jaume Segura
A modern look at the CMOS stuck-open fault. LATW (2009)
Roberto Gómez, Alejandro Girón, Víctor H. Champac
A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines. J. Electron. Test. 24 (6) (2008)
Roberto Gómez, Alejandro Girón, Víctor H. Champac
Test of Interconnection Opens Considering Coupling Signals. DFT (2005)