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Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths.

Hector VillacortaCharles F. HawkinsVíctor H. ChampacJaume SeguraRoberto Gómez
Published in: IEEE Des. Test (2013)
Keyphrases
  • reliability analysis
  • signal processing
  • path length
  • frequency domain
  • neural network
  • case study
  • shortest path
  • data mining
  • object oriented
  • decision makers
  • decision support system