Testing of Stuck-Open Faults in Nanometer Technologies.
Víctor H. ChampacJulio Vazquez HernandezSalvador BarceloRoberto GómezChuck HawkinsJaume SeguraPublished in: IEEE Des. Test Comput. (2012)
Keyphrases
- test cases
- fault model
- fault detection
- fault diagnosis
- open systems
- expert systems
- test suite
- knowledge base
- open standards
- neural network
- real time
- st century
- databases
- software testing
- human factors
- data sets
- genetic algorithm
- electron microscopy
- test sequences
- web technologies
- test set
- x ray
- web applications
- object oriented