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An accurate novel gate-sizing metric to optimize circuit performance under local intra-die process variations.
Zahira Perez
Hector Villacorta
Víctor H. Champac
Published in:
VLSI-SoC (2018)
Keyphrases
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data sets
machine learning
high quality
high accuracy
process model
computer vision
information systems
website
image sequences
bayesian networks
motion estimation
design process