Impact of Fin-Height on SRAM Soft Error Sensitivity and Cell Stability.

Hector Villacorta Jaume Segura Víctor H. Champac

Published in: J. Electron. Test. (2016)

Keyphrases

stability of feature selection
error rate
power consumption
relative error
variance reduction
low cost
sensitivity analysis
generalization error
error analysis
training set
wireless sensor networks
high sensitivity