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Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell.

Víctor H. ChampacJavier MesallesHector VillacortaFabian Vargas
Published in: J. Electron. Test. (2021)
Keyphrases
  • detection accuracy
  • automatic analysis
  • information systems
  • detection method
  • false positives
  • automatic detection
  • power consumption
  • structural analysis
  • automated analysis
  • automated detection