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Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations.

Víctor H. ChampacHector VillacortaRoberto Gómez-FuentesFabian VargasJaume Segura
Published in: J. Electron. Test. (2024)
Keyphrases
  • power consumption
  • data mining
  • database systems
  • expert systems
  • infrared
  • process model
  • failure rate