Danijel Dankovic

Publication Activity (10 Years)

Years Active: 2002-2023
Publications (10 Years): 6

Top Topics

Monitoring System

Ionizing Radiation

Knowledge Practices

Power Allocation

Top Venues

Microelectron. Reliab.

J. Ambient Intell. Smart Environ.

IEEE Trans. Educ.

Publications

Marko S. Andjelkovic, Junchao Chen, Rizwan Tariq Syed, Fabian Vargas, Markus Ulbricht, Milos Krstic, Stefan D. Ilic, Milos Marjanovic, Sandra Veljkovic, Nikola Mitrovic, Danijel Dankovic, Goran S. Ristic, Russell Duane, Nikola Vasovic, Aleksandar Jaksic, Alberto J. Palma, Antonio M. Lallena, Miguel A. Carvajal
Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System. DSD (2023)
Danijel Dankovic, Milos Marjanovic, Nikola Mitrovic, Emilija Zivanovic, Milan Dankovic, Aneta Prijic, Zoran Prijic
The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering. IEEE Trans. Educ. 66 (2) (2023)
Sandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic
Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress. J. Circuits Syst. Comput. 31 (18) (2022)
Milos Djordjevic, Branislav Jovicic, Stefan Markovic, Vesna Paunovic, Danijel Dankovic
A smart data logger system based on sensor and Internet of Things technology as part of the smart faculty. J. Ambient Intell. Smart Environ. 12 (4) (2020)
Ninoslav Stojadinovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Srboljub Stankovic, Aneta Prijic, Zoran Prijic, Ivica Manic, Danijel Dankovic
NBTI and irradiation related degradation mechanisms in power VDMOS transistors. Microelectron. Reliab. (2018)
Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Zoran Prijic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, D. Spassov, Ninoslav Stojadinovic
A review of pulsed NBTI in P-channel power VDMOSFETs. Microelectron. Reliab. 82 (2018)
Danijel Dankovic, Ljubomir Vracar, Aneta Prijic, Zoran Prijic
An Electromechanical Approach to a Printed Circuit Board Design Course. IEEE Trans. Educ. 56 (4) (2013)
Ivica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions. Microelectron. Reliab. 51 (9-11) (2011)
Ninoslav Stojadinovic, Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic
Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress. Microelectron. Reliab. 50 (9-11) (2010)
Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic
Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs. Microelectron. Reliab. 49 (9-11) (2009)
Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Ninoslav Stojadinovic
Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs. IET Circuits Devices Syst. 2 (2) (2008)
Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic
Negative bias temperature instability in n-channel power VDMOSFETs. Microelectron. Reliab. 48 (8-9) (2008)
Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic
Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs. Microelectron. Reliab. 47 (9-11) (2007)
Danijel Dankovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic
NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs. Microelectron. Reliab. 46 (9-11) (2006)
Ninoslav Stojadinovic, Ivica Manic, Vojkan Davidovic, Danijel Dankovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Sima Dimitrijev
Effects of electrical stressing in power VDMOSFETs. Microelectron. Reliab. 45 (1) (2005)
Ninoslav Stojadinovic, Danijel Dankovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Ivica Manic, Snezana Golubovic
Negative bias temperature instability mechanisms in p-channel power VDMOSFETs. Microelectron. Reliab. 45 (9-11) (2005)
Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Sima Dimitrijev
Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs. Microelectron. Reliab. 42 (9-11) (2002)