Albena Paskaleva

Publication Activity (10 Years)

Years Active: 2002-2022
Publications (10 Years): 2

Top Topics

Power Allocation

Multiple Access

Top Venues

Microelectron. Reliab.

J. Circuits Syst. Comput.

Publications

Sandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic
Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress. J. Circuits Syst. Comput. 31 (18) (2022)
Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Zoran Prijic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, D. Spassov, Ninoslav Stojadinovic
A review of pulsed NBTI in P-channel power VDMOSFETs. Microelectron. Reliab. 82 (2018)
Elena Atanassova, Nenad Novkovski, D. Spassov, Albena Paskaleva, A. Skeparovski
stack. Microelectron. Reliab. 54 (2) (2014)
Elena Atanassova, Albena Paskaleva, D. Spassov
films for dynamic memories applications at the nanoscale. Microelectron. Reliab. 52 (4) (2012)
D. Spassov, Elena Atanassova, Albena Paskaleva
: Electrical properties and mechanisms of conductivity. Microelectron. Reliab. 51 (12) (2011)
Elena Atanassova, Nenad Novkovski, Albena Paskaleva, D. Spassov
stacks. Microelectron. Reliab. 50 (6) (2010)
Elena Atanassova, Albena Paskaleva, Nenad Novkovski
stacks. Microelectron. Reliab. 48 (4) (2008)
Elena Atanassova, Ninoslav Stojadinovic, Albena Paskaleva
stacks and its dependence on the gate electrode. Microelectron. Reliab. 48 (8-9) (2008)
Elena Atanassova, Albena Paskaleva
as high-k dielectric for nanoscale DRAMs. Microelectron. Reliab. 47 (6) (2007)
Albena Paskaleva, Martin Lemberger, Anton J. Bauer
Polarity asymmetry of stress and charge trapping behavior of thin Hf- and Zr-silicate layers. Microelectron. Reliab. 47 (12) (2007)
Elena Atanassova, D. Spassov, Albena Paskaleva
stack capacitors. Microelectron. Reliab. 47 (12) (2007)
Albena Paskaleva, Anton J. Bauer, Martin Lemberger
O films. Microelectron. Reliab. 45 (7-8) (2005)
Martin Lemberger, Albena Paskaleva, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel
Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor. Microelectron. Reliab. 45 (5-6) (2005)
Albena Paskaleva, Martin Lemberger, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel
Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors. Microelectron. Reliab. 43 (8) (2003)
Elena Atanassova, Albena Paskaleva
layers on Si for high density DRAMs. Microelectron. Reliab. 42 (2) (2002)