Heiner Ryssel

Publication Activity (10 Years)

Years Active: 1985-2013
Publications (10 Years): 0

Top Topics

Mechanisms Underlying

Mathematical Analysis

Top Venues

Microelectron. Reliab.

Publications

Z. Ouennoughi, C. Strenger, F. Bourouba, V. Haeublein, Heiner Ryssel, Lothar Frey
Conduction mechanisms in thermal nitride and dry gate oxides grown on 4H-SiC. Microelectron. Reliab. 53 (12) (2013)
Martin Le-Huu, Holger Schmitt, Stefan Noll, Michael Grieb, Frederik F. Schrey, Anton J. Bauer, Lothar Frey, Heiner Ryssel
Investigation of the reliability of 4H-SiC MOS devices for high temperature applications. Microelectron. Reliab. 51 (8) (2011)
Mathias Rommel, Anton J. Bauer, Heiner Ryssel
Quantitative oxide charge determination by photocurrent analysis. Microelectron. Reliab. 47 (4-5) (2007)
Martin Lemberger, Albena Paskaleva, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel
Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor. Microelectron. Reliab. 45 (5-6) (2005)
Albena Paskaleva, Martin Lemberger, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel
Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors. Microelectron. Reliab. 43 (8) (2003)
S. Strobel, Anton J. Bauer, Matthias Beichele, Heiner Ryssel
Suppression of boron penetration through thin gate oxides by nitrogen implantation into the gate electrode in PMOS devices. Microelectron. Reliab. 41 (7) (2001)
Matthias Beichele, Anton J. Bauer, Heiner Ryssel
O ambient. Microelectron. Reliab. 41 (7) (2001)
Michael P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel
Electrical reliability aspects of through the gate implanted MOS structures with thin oxides. Microelectron. Reliab. 41 (7) (2001)
Walter Bohmayr, Alexander Burenkov, Jürgen Lorenz, Heiner Ryssel, Siegfried Selberherr
Monte Carlo simulation of silicon amorphization during ion implantation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17 (12) (1998)
Peter Pichler, Heiner Ryssel
Simulation of silicon semiconductor processing. Eur. Trans. Telecommun. 1 (3) (1990)
Jürgen Lorenz, Joachim Pelka, Heiner Ryssel, Albert Sachs, Albert Seidl, Milos Svoboda
COMPOSITE -- A Complete Modeling Program of Silicon Technology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 4 (4) (1985)