Conduction mechanisms in thermal nitride and dry gate oxides grown on 4H-SiC.
Z. OuennoughiC. StrengerF. BouroubaV. HaeubleinHeiner RysselLothar FreyPublished in: Microelectron. Reliab. (2013)
Keyphrases
- field effect transistors
- steady state
- high density
- mathematical analysis
- electrical properties
- magnetic recording
- mechanisms underlying
- finite element analysis
- mechanism design
- infrared
- data sets
- learning algorithm
- machine learning
- real time
- computational models
- evolutionary algorithm
- multiscale
- information systems
- genetic algorithm
- databases
- thermal imaging